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Copper exchanged Silicalite-1: evidence of the location of copper oxide nanoclusters in the supermicropores of S-1

机译:铜交换硅沸石-1:氧化铜纳米能器在S-1的超氧化铜纳米能器的位置

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In the present contribution we report some results of a study concerning the texture features of the silicalite S-1 (which is a SiO2 polymorph having the zeolite MFI framework-type) as prepared and after the introduction of copper (1.38 % wt). Copper is loaded by an ion-exchange that is made possible by the internal silanol nests of the defective structure. The porosimetric analysis is able to reveal two important characteristics of these materials. It provides evidence about the presence (i) of supermicropores that are created by Si(IV) vacancies in the MFI framework, and (ii) copper oxide entrapped in these cavities as nanoclusters. The (CuO)_n nanoclusters are characterized by a low nuclearity (n). This is suggested by different techniques as X-ray powder diffraction (XRPD), UV-Vis diffuse reflectance spectroscopy (UV-Vis DRS) and magnetic susceptibility measurements. Indeed, if compared to the parent material, the copper-loaded silicalite shows a sharp reduction of the low-pressure hysteresis loop associated to a decreasing of both the total (BET) surface area and the micropore volume, all these findings supporting the picture that the copper oxide nanoclusters are confined in the supermicropores of the S-1 material.
机译:在目前的贡献中,我们报告了关于硅晶体S-1的质地特征的研究结果,如制备的铜(1.38%wt)之后的制备和在引入铜(1.38%)之后的硅晶S-1(具有沸石MFI框架型的SiO 2多晶型物)的研究结果。铜由离子交换装载,该离子交换由缺陷结构的内部硅烷醇巢组成。孔隙测量分析能够揭示这些材料的两个重要特征。它提供了关于由MFI框架中的Si(IV)空位的Supermropores的存在(I)的存在证据,并且(ii)夹在这些腔中作为纳米团簇的铜氧化物。 (CUO)_N纳米能器的特征在于核心低(n)。这是通过不同的技术提出的,作为X射线粉末衍射(XRPD),UV-VI扩散反射光谱(UV-VIS DRS)和磁敏感度测量。实际上,如果与母材相比,铜负载的硅钻显示出与总(BET)表面积和微孔体积的减少相关的低压滞后环的急剧减小,所有这些调查结果都支持图片氧化铜纳米团簇局限于S-1材料的超微孔中。

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