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The Investigation of Intermetallic Compound Morphology Effect on the Solder Joint Performance

机译:金属间化合物形态对焊接关节性能的研究

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In this investigation, normal and high speed ball shear test were used to evaluate the solder joint performance. Solder residual fracture mode is always being found in normal ball shear for low strain rate. The strength of solder balls are directly associated with their mechanical property in normal ball shear test. High speed ball shear provide a easier way to judge the solder joint performance at high strain rate compare with ball level drop test. Peak force and energy are from force-displacement curve in high speed ball shear that can not be a judgment standard for the overlapping among different failure mode in real test situation. After high speed ball shear, the brittle fracture surface were inspected and examined by focus ion beam (FIB) treatment. Electrolytic nickel/gold (Ni/Au) deposition process has being used widely to provide flat, solderable pad surface finish on area array (BGA or CSP) packages and printed wiring boards (PWB). Recently, a new surface finish - electroless nickel/electroless palladium/immersion gold (ENEPIG) process has been introduced to improve solder joint performance. These two surface finish with Sn3.5Ag and Sn1Ag0.5Cu solder will be estimated. Sn3.5Ag has better performance with Ni/Au surface finish. For ENEPIG surface finish, Sn1Ag0.5Cu shows superior performance under high speed ball shear test.
机译:在该调查中,正常和高速球剪切试验来评价焊接接头的性能。焊料残余断裂模式总是被在正常焊球剪切为低应变速率发现。焊球的强度直接与在正常球剪切测试它们的机械性能相关联。高速球剪切提供一个更简单的方法来判断在与球的水平跌落试验比较高应变率焊点性能。峰值力和能量是从在高速焊球剪切力 - 位移曲线不能对之间在实际测试的情况不同的故障模式中的重叠的判断标准。高速焊球剪切后,脆性断面进行了检查,并通过聚焦离子束(FIB)处理检查。电解镍/金(Ni / Au)的沉积工艺已经被广泛地用于提供平坦的,区域阵列(BGA或CSP)封装和印刷电路板(PWB)上焊垫的表面光洁度。最近,一种新的表面处理 - 化学镀镍/电镀钯/浸金(ENEPIG)工艺已被引入到提高焊点的性能。这些与Sn3.5Ag和Sn1Ag0.5Cu焊料2分的表面光洁度会被估计。 Sn3.5Ag与镍/金表面光洁度更好的性能。对于ENEPIG表面光洁度,Sn1Ag0.5Cu示出了在高速球剪切测试性能优越。

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