Constructing a Test Item Generator for Program Debugging Assessment

摘要

In this paper, we aim to construct a debugging test item generator which can generate the buggy patterns for novice's program concept assessment. However, there are some technical issues in constructing the test item generator. How do we model the buggy program for debugging test items? How do we represent the concept of program statement for cognitive assessment? To solve the issues above, we propose a Debugging Test Item Generator (DTIG) system to support the debugging test item generation. The stereotyped format and structure of program statements are modeled by the Frame-based Programming Concept Hierarchy (FPCH) model with the concepts of ontology. The buggy pattern ontology is proposed to associate the buggy patterns with the program statement concepts and generate the debugging test items automatically.