APPARATUS AND METHOD FOR DETERMINING PRIORITY OF DEBUGGING TEST ITEMS ASSOCIATED WITH DEBUGGING TEST PROGRAM OF SEMICONDUCTOR

摘要

The present invention discloses an apparatus and method for prioritizing test items related to debugging a semiconductor test program. According to an embodiment of the present invention, there is provided an apparatus for determining a priority of at least one test item associated with debugging of a semiconductor test program, the test item prioritization apparatus comprising: A priority calculation unit for calculating priority values of the at least one test item based on weights related to the test time, a first priority value associated with the first test item and a second test item associated with the second test item, And comparing the first test item with the second test item in the test item ranking table when the first priority value is lower than the second priority value, And a test item placement unit arranged in a row.