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Ultra-Thin Single- and Double-Gate MOSFETs for Future ULSI Applications:Measurements, Simulations, and Open Issues

机译:用于未来ULSI应用的超薄单栅和双栅极MOSFET:测量,模拟和开放问题

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CMOS technology represents the backbone of today's semiconductor industry andthe enabler for the implementation of complex systems on single chips. The ITRSRoadmap is clearly pushing CMOS technology toward its limits to fulfillextremely demanding requirements even for near-term products.' The scaling ofthe MOS transistor to physical channel lengths below 70 nm is projected to occurby the years 2004-2005, despite the fact that the shrinkage of the bulk MOSFETto this gate-length range presents some issues that have no known solutions.'
机译:CMOS技术代表了当今半导体行业的骨干,以及在单个芯片上实现复杂系统的推动者。 ITRSRoadMap显然将CMOS技术推向其甚至近期产品的富勒西克斯苛刻要求的限制。 2004-2005年,MOS晶体管将MOS晶体管到70nm低于70nm的物理通道长度,尽管该门长度范围的散装MOSFETTO的收缩呈现了没有已知解决方案的一些问题。“

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