首页> 外文会议>IEEE/LEOS International Conference on Optical MEMS and Nanophotonics >Design and fabrication of compact etched diffraction grating demultiplexers based on α-Si nanowire technology
【24h】

Design and fabrication of compact etched diffraction grating demultiplexers based on α-Si nanowire technology

机译:基于α-Si纳米线技术的紧凑型衍射光栅多路分解器的设计与制造

获取原文
获取外文期刊封面目录资料

摘要

Silicon nanowire waveguides and related etched diffraction grating (EDG) demultiplexers are studied by α-Si-on-SiO{sub}2 technology. Compact EDG demultiplexers with 10nm spacing for both echelle and total-internal-reflection (TIR) facets have been fabricated and characterized.
机译:通过α-Si-on-SiO {Sub} 2技术研究了硅纳米线波导和相关蚀刻的衍射光栅(EDG)多路分解器。具有10nm间距的紧凑型EDG多路分解器,用于梯度和全内反射(TIR)刻面,并表征。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号