Generating tests to verify system-on-chips (SoC) is difficult because the complexities from the number of transistors on a silicon chip have surpassed the capabilities of conventional test methods. This paper proposes a method to generate test cases using genetic and evolutionary algorithms. We show how to adopt an evolutionary test generator in a SoC verification platform instead of creating tests using randomisation only. The evolutionary method optimises the testing process based on the verification coverage fed back from the design under test. Experiments are conducted comparing against previous methods. The results are promising and show the effectiveness of the new technique.
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