首页> 外文会议>TMS Annual Meeting Exhibition >PREPARATION AND CHARACTERIZATION OF ZnS THIN FILMS USING CHEMICAL BATH DEPOSITION METHOD: EFFECTS OF DEPOSITION TIME AND THERMAL TREATMENT
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PREPARATION AND CHARACTERIZATION OF ZnS THIN FILMS USING CHEMICAL BATH DEPOSITION METHOD: EFFECTS OF DEPOSITION TIME AND THERMAL TREATMENT

机译:使用化学浴沉积法制备ZnS薄膜的制备与表征方法:沉积时间和热处理的影响

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This research focuses on zinc sulphide (ZnS) thin film preparation using the chemical bath deposition (CBD) method. The obtained product is to be used as the Cd-free buffer layer for CIGS solar cells. Zinc sulfate, thiourea, hydrazine, and ammonium hydroxide concentrations were carefully selected to synthesize the ZnS thin films. The deposition time and annealing effects on the optical and electrical properties were studied. Scanning electron micrographs showed that the film surface consisted of small uniform grains (about 40 nm in size) and were free of pin-hole defects. Field emission scanning electron micrographs reveals that the film thickness ranged from 50 to 120 nm. Hall Effect measurements indicated that the synthesized ZnS was an n-type semiconductor with a resistivity of 2 × 10~3 - 9 × 10~3 OMEGA cm. The as-deposited ZnS thin films exhibited high light transmittance, between 89.5% and 90.8%. The transmittance values decreased to 69.9%-71.2% after thermal annealing at 400°C for 420 min. The chemical composition of the resulting ZnS thin films are discussed in terms of the CBD process deposition time and thermal treatment.
机译:本研究侧重于使用化学浴沉积(CBD)方法的硫化锌(ZnS)薄膜制备。所得产物用作CIGS太阳能电池的无CD-缓冲层。粒料选择硫酸锌,硫酸,肼和氢氧化铵浓度,以合成ZnS薄膜。研究了对光学和电性能的沉积时间和退火效应。扫描电子显微照片显示薄膜表面由小均匀颗粒(大小约40nm)组成并且没有针孔缺陷。场发射扫描电子显微照片显示膜厚度范围为50至120nm。霍尔效应测量表明,合成的ZnS是一个n型半导体,其电阻率为2×10〜3 - 9×10〜3ωcm。沉积的ZnS薄膜表现出高透光率,89.5%和90.8%。在400℃下热退火420分钟后,透射率值降至69.9%-71​​.2%。就CBD工艺沉积时间和热处理而讨论了所得ZnS薄膜的化学成分。

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