首页> 外文会议>International Conference on Electrophoretic Deposition >Electrophoretic Deposition of Smectite Particles onto Cupper Plate
【24h】

Electrophoretic Deposition of Smectite Particles onto Cupper Plate

机译:蒙胶岩颗粒电泳沉积在托盘板上

获取原文

摘要

Layered clay has been of great interest because of their nano-sized layer structure and hence intercalation and ion-exchange capacity to be used as a host material of composite with polymers and/or metals. In this study, smectite as a silicate-layered clay was easily exfoliated and dispersed into purified water, and was deposited onto a cupper plate for which dc voltage ranging from + 1.0 V to + 6.0 V was applied with respect to a counter platinum plate electrode. The cupper plate was pre-treated by chemical and chemical mechanical polishing (CP and CMP) prior to the electrophoretic deposition (EPD). The surface roughness of the substrate as well as the smectite film formed was characterized by an atomic force microscope (AFM). The thickness of smectite layer was estimated using an X-ray fluorescence (XRF) analysis as well as a scanning electron microscope (SEM) observation. The layer thickness can be described as a function of operational parameters such as applied voltage and operating time. Smooth smectite film with thickness ranging from 100 nm to 10 μm has been successfully fabricated onto the CMP cupper plate by the EPD method in this study.
机译:由于它们的纳米大小层结构,层状粘土具有很大的兴趣,因此嵌入和离子交换能力用作具有聚合物和/或金属的复合材料的主体材料。在该研究中,蒙脱石作为硅酸盐层状粘土易于剥离并分散到纯净的水中,并沉积在逆铂板电极上施加来自+ 1.0V至+ 6.0V的DC电压的托盘板上。在电泳沉积(EPD)之前,通过化学和化学机械抛光(CP和CMP)预处理托盘板。形成的基材的表面粗糙度以及形成的蒙脱岩膜的特征在于原子力显微镜(AFM)。使用X射线荧光(XRF)分析以及扫描电子显微镜(SEM)观察来估计蒙脱层层的厚度。层厚度可以描述为诸如施加的电压和操作时间的操作参数的函数。通过本研究中的EPD方法成功地制造在100nm至10μm的厚度范围为100nm至10μm的光滑蒙脱膜。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号