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首页> 外文期刊>Key Engineering Materials >Electrophoretic Deposition of Smectite Particles onto Cupper Plate
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Electrophoretic Deposition of Smectite Particles onto Cupper Plate

机译:蒙脱石颗粒在铜板上的电泳沉积

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摘要

Layered clay has been of great interest because of their nano-sized layer structure and hence intercalation and ion-exchange capacity to be used as a host material of composite with polymers and/or metals. In this study, smectite as a silicate-layered clay was easily exfoliated and dispersed into purified water, and was deposited onto a cupper plate for which dc voltage ranging from + 1.0 V to + 6.0 V was applied with respect to a counter platinum plate electrode. The cupper plate was pre-treated by chemical and chemical mechanical polishing (CP and CMP) prior to the electrophoretic deposition (EPD). The surface roughness of the substrate as well as the smectite film formed was characterized by an atomic force microscope (AFM). The thickness of smectite layer was estimated using an X-ray fluorescence (XRF) analysis as well as a scanning electron microscope (SEM) observation. The layer thickness can be described as a function of operational parameters such as applied voltage and operating time. Smooth smectite film with thickness ranging from 100 nm to 10 μm has been successfully fabricated onto the CMP cupper plate by the EPD method in this study.
机译:层状粘土由于其纳米尺寸的层结构以及因此被用作与聚合物和/或金属复合的基质材料的插层和离子交换能力而备受关注。在这项研究中,蒙脱石作为硅酸盐层状粘土很容易剥落并分散在纯净水中,然后沉积在铜板上,相对于铂对电极,铜板施加的直流电压范围为+ 1.0 V至+ 6.0 V 。在电泳沉积(EPD)之前,对铜板进行化学和化学机械抛光(CP和CMP)预处理。用原子力显微镜(AFM)表征基材以及形成的蒙脱石膜的表面粗糙度。使用X射线荧光(XRF)分析以及扫描电子显微镜(SEM)观察来估计绿土层的厚度。层厚度可以描述为操作参数的函数,例如施加的电压和操作时间。在本研究中,已经通过EPD方法成功地在CMP铜板上制造了厚度范围为100 nm至10μm的光滑蒙脱石薄膜。

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