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Influence of Additives on Surface Smoothness and Polytype Stability in Solution Growth of n-Type 4H-SiC

机译:添加剂对N型4H-SIC溶液生长的表面光滑度和聚型稳定性的影响

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We have investigated the dependence of the macrostep height on various additives in solution growth of n-type 4H-SiC. Surface modification by adding transition elements in periods 4-6 (Sc, Ti, V, Mn, Fe, Co, Ni, Cu, Y, Nb, Mo, Ce, and W) and group 13-14 elements (B, Al, Ga, Ge, Sn) was systematically studied to find additives improving smoothness of the growth surface. We found that Sc, Co, Mo, and Ge improved surface smoothness in addition to the already-known additives, such as Al, B, and Sn. Besides, these additives (Sc, Co, Mo, Ge) give no measurable influence on the conductivity of n-type grown crystals. These results demonstrated that Sc, Co, Mo, Ge and Sn are useful additives for solution growth of n-type 4H-SiC.
机译:我们研究了宏酮高度对溶液生长的各种添加剂的依赖性,N型4H-SiC。通过在4-6周期(SC,Ti,V,Mn,Fe,Co,Ni,Cu,Cu,Cu,Y,Nb,Mo,Ce和W)和第13-14组元素(B,Al,系统地研究了Ga,Ge,Sn)以发现添加剂改善生长表面的光滑度。除了已知的添加剂之外,我们发现SC,Co,Mo和Ge改善了表面光滑度,例如Al,B和Sn。此外,这些添加剂(SC,Co,Mo,Ge)对N型生长晶体的电导率没有可测量的影响。这些结果表明SC,Co,Mo,Ge和Sn是N型4H-SiC溶液生长的有用添加剂。

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