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Measurements of surface forces by AFM (Dependence of force curve on relative humidity)

机译:AFM测量表面力(力曲线对相对湿度的依赖性)

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The atomic force microscope (AFM) is a powerful and widely used tool for investigating micro/nano properties of surfaces. The force curve is generally used for measuring the surface interaction forces in AFM. In this study, dependence of force curve on relative humidity was investigated experimentally using the AFM in the environment-controlled chamber. It was found that the water meniscus bridge would be formed due to the capillary condensation of water vaper in the air when the relative humidity is higher than 70%.
机译:原子力显微镜(AFM)是一种强大而广泛使用的工具,用于研究表面的微/纳米特性。力曲线通常用于测量AFM中的表面相互作用力。在该研究中,在环境控制室中使用AFM实验研究了力曲线对相对湿度的依赖性。发现当相对湿度高于70%时,由于空气中的水触发器的毛细血管缩合,将形成水弯月面桥。

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