interatomare strength measurements using passive drift compensated in situ atomic force microscopy (afm) - quantification of kalibrieer arguing between electronic orbital by direct force measurement in subatomic lateral resolution

摘要

In this invention are interatomic forces with submolecular lateral resolution measured by means of calibrated in - situ not - contact and passively against thermal drift compensated atomic force microscopy in aqueous or, in general, a liquid environment, as a result of which that is to say interatomic forces between the individual electronic orbital can be observed. As a standard - sample for the calibration is a calcium carbonate - crystal, which in the case of a well-defined pressure and temperature, a phase transition from the calcite - for aragonite - crystal lattice - structure, and thus supplies a direct mapping of this phase transition an exact force - an anchor point for the force - distance - curve of the afm – which in reality the force f is plotted against a relative sample position z – completely independently of regular instrument - calibrations are usually described only via the spring constant of the commercially available sampling springs. In addition to an independent force calibration, is also referred to here an independent calibration of the actual point - sample - distance d is obtained by reacting directly oscillatory (steric) solution of forces is observed and the simple stem from the package effects of the liquid particles in the case of very small tip - sample - intervals that based on these accurate, instrument - independent in - situ calibration can interatomic forces between the electronic orbital of the foremost acute atom and of the respectively opposite samples atom quantitatively be measured with of subatomic lateral resolution. A key in order to achieve this extreme sensitivity, it is, the afm in the simple " variable deflection mode " in the not contact - region, while the spring constant of the sampling spring just been selected is rigid enough, so that no instability, i.e, no " jump - in - contact " – in the force - offset curves is observed in the given environment, which in this case, for example, a highly dilute calcium carbonate - solution; however, on the other hand, should the spring constant of the sampling spring in such a soft as possible. For the calcite - water - system and the mica - 150 mm nacl solution - - - a system, this spring constant at approximately the order of magnitude of 0,1 n / m. The possible in this way not - contact - operation of the afm, wherein only purely attractive total - forces between the extreme front acute atom and opposite samples atom arise, is then extended to a dynamic (oscillatory) atomic force microscopy - method in liquid in the case of (almost) so far only atomic resolution, which a howling control apparatus of the " flight - height " of the tip over the sample, and thus also a constant - heights - / constant - change - mode of action, which directly by way of the z - piezoelectric actuator is calibrated altitude information by means of topographic structure on the true atomic scale supplies.