A simple method to characterize and accurately remove the effects of push-on connectors

摘要

Push-on (blind mate) connectors are commonly used in SI fixture design and device connectivity. They are made by a variety of manufacturers and are specified for frequency ranges to 40, 65, or 100 GHz. They provide a higher density of connections that typical threaded SMA connectors. A long standing issue with these connectors is calibration. There are no or very limited calibration kits (usually only to 18 GHz). This paper proposes a simple method to characterize these connectors over the full frequency range without a special calkit. Results will be compared to EM Simulation data for the connectors and adapters.