Dual energy CT-scanning is a rapidly emerging imaging technique employed in non-destructive evaluation of various materials. Although CT (Computerized Tomography) has been used for characterizing rocks and visualizing and quantifying multiphase flow through rocks for over 25 years, most of the scanning is done at a voltage setting above 100 kV for taking advantage of the Compton scattering (CS) effect, which responds to density changes. Below 100 kV the photoelectric effect (PE) is dominant which responds to the effective atomic numbers (Zeff), which is directly related to the photo electric factor. Using the combination of the two effects helps in better characterization of reservoir rocks. The most common technique for dual energy CT-scanning relies on homogeneous calibration standards to produce the most accurate decoupled data. However, the use of calibration standards with impurities increases the probability of error in the reconstructed data and results in poor rock characterization. This work combines ICP-OES (inductively coupled plasma optical emission spectroscopy) and LIBS (laser induced breakdown spectroscopy) analytical techniques to quantify the type and level of impurities in a set of commercially purchased calibration standards used in dual-energy scanning. The Zeff data on the calibration standards with and without impurity data were calculated using the weighted linear combination of the various elements present and used in calculating Zeff using the dual energy technique. Results show 2 to 5% difference in predicted Zeff values which may affect the corresponding log calibrations. The effect that these techniques have on improving material identification data is discussed and analyzed. The workflow developed in this paper will translate to a more accurate material identification estimates for unknown samples and improve calibration of well logging tools.
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