QUARTZ TUNING FORK ATOMIC FORCE MICROSCOPY USING A QUALITY-FACTOR CONTROL

摘要

The use of a quality-factor control device has been demonstrated to increase theresolution image of quartz tuning fork with atomic force microscopy by lowering the quality factor Q of the oscillating probe. By electronically, Q-control has been implemented and used to decrease the quality factor of the quartz tuning fork in air environment. Topographic images of the standard samples were used to demonstrate this technique.