MIMCAP dynamic leakage impact to switched-capacitor sigma-delta converters in deep-submicron digital CMOS processes

摘要

This paper describes the performance of sigma-delta analog-to-digital converters in a 130nm CMOS digital process and the impact of the dynamic leakage of metal-insulalor-metal capacitor (MIMCAP). A second-order sigma-delta analog-to-digital converter (ADC) for voice applications is built in a 130nm digital CMOS process. The leakage effect from the MTMCAP is investigated and correlated with idle-channel noise (ICN) performance. Dithering is applied to reduce the idle-channel tones and improve the linearity of the ADC.