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Novel base doping profile for improved speed and power

机译:新型基础掺杂型材,用于提高速度和功率

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We have experimentally studied the effect of two new base doping profiles on the base transit time of a GaAs npn heterojunction bipolar transistor. The doping in a region close to the collector is reduced either by a doping grade or a stepwise reduction. Quasi-electric fields resulting from these doping gradients increase the minority carrier velocity and the beta of large area transistors. By focusing these doping changes adjacent to the collector, the amount of low-doped base material and the resulting increase in base sheet resistance can be minimized. For both a step change in doping or graded doping change a 10% decrease in base transit time is achieved while only causing a 4 % increase in base sheet resistance. The impact on base transit time is confirmed with f/sub T/ data on small area devices.
机译:我们已经通过实验研究了两个新的基础掺杂曲线对GaAs NPN异质结双极晶体管的基站传输时间的影响。靠近收集器的区域中的掺杂通过掺杂等级或逐步减少来减小。由这些掺杂梯度引起的准电器领域增加了大面积晶体管的少数载波速度和β。通过将这些掺杂变化聚焦在收集器附近,可以最小化低掺杂的基材和基础薄层电阻的增加的增加。对于掺杂或分级掺杂变化的步骤变化,实现了基础传输时间的10%降低,同时仅导致基板电阻增加4%。在小区域设备上使用F / SUM T / DATA确认对基础传输时间的影响。

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