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Locating Large-Scale Craniofacial Feature Points on X-ray Images for Automated Cephalometric Analysis

机译:在X射线图像上定位大规模的Craniofacial特征点,用于自动脑电图分析

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With the objective of tracing out all craniofacial structures in parallel with landmarking on x-ray images in cephalometry for the first time, a novel approach is proposed to locate 262 feature points composed of 90 landmarks and 172 auxiliary points. Twelve landmarks are identified by classical image processing techniques and a pattern matching algorithm, and then are used to divide the craniofacial shape to ten independent regions according to the anatomical knowledge. For each region, principal component analysis is employed to statistically characterize its shape and the gray profile of every feature point in the training, and a modified active shape model is proposed for localization. We conclude with experiment results and some discussion.
机译:在首次将所有颅面结构与X射线图像中的X射线图像上进行追踪,提出了一种新的方法来定位由90个地标和172个辅助点组成的262个特征点。通过经典图像处理技术和模式匹配算法识别十二个地标,然后根据解剖学知识用于将颅面形状划分为十个独立区域。对于每个区域,使用主成分分析来统计表征其训练中每个特征点的形状和灰度轮廓,并且提出了一种修改的有源形状模型来定位。我们通过实验结果和一些讨论得出结论。

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