Research on Modeling and Analysis of Testability for Complex Electronic System

摘要

Due to the lack of effective modeling and analysis methods for testability of complex electronic system, a testability index model is established to resolve this problem. First of all, the existing testability demonstration test and evaluation method are analyzed. On this basis, testability indexes statistical models based on the binomial distribution, or Beta distribution and F distribution are established. What's more, the relationship and principle between the fault detection or isolation data and the confidence level are analyzed in these models. Finally, the result of simulation shows that these models are practical and effective, which provides a new way of effectively analyzing and evaluating testability indexes of complex electronic system.