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Phase Stepping Shearography and Electronic Speckle Pattern Interferometry

机译:阶段步进剪切和电子斑点图案干涉法

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Electronic Speckle Pattern Interferometry (ESPI) and Digital Shearography have been shown to be of great value for the Non-destructive Evaluation of the integrity of materials and manufactured components. The NDT Laboratory in the Department of Mechanical Engineering at the University of Cape Town has an active research group focused on the research, development and the various applications of ESPI and Digital Shearography. This work culminated in the development of portable prototype inspection systems based on Digital Shearography and ESPI. The current portable systems, mentioned above, generate intensity based fringe patterns. By introducing a known phase shift into the speckle pattern during the image recording process, displacement fringe patterns, based on the change in phase of the laser light, can be generated. These fringe patterns differ in that they reveal distinct 2π discontinuities and are thus suited for automated inspection techniques and are also suited for object surface displacement mapping techniques. This paper reports on the progress made in developing phase stepped ESPI and Digital Shearography. The techniques are described and applied to selected flawed composite samples. The findings are presented and comparisons are drawn between the results obtained from both phase stepping and conventional intensity based optical interference techniques. The possibility of applying phase stepping techniques to portable inspection systems is also discussed.
机译:电子散斑图案干涉测量(ESPI)和数字牧草被证明对无损评估材料和制造部件的完整性的非破坏性评估具有重要价值。开普敦大学机械工程系的NDT实验室有一个积极的研究小组,专注于ESPI和数字牧草的研究,开发和各种应用。这项工作有助于基于数字剪切术和ESPI的便携式原型检测系统的开发。下面提到的当前便携式系统产生基于强度的条纹图案。通过在图像记录过程期间将已知的相移进入散斑图案,可以产生基于激光的相位的位移条纹图案。这些条纹图案的不同之处在于它们揭示了不同的2π不连续性,因此适用于自动检查技术,并且也适用于物体表面位移映射技术。本文报告了开发阶段阶梯式ESPI和数字牧草的进展。描述并施加到所选择的漏平复合样品上的技术。提出了发现,并且在从相跨度和基于传统的基于强度的光学干扰技术获得的结果之间绘制比较。还讨论了将阶段步进技术应用于便携式检查系统的可能性。

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