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Preparation of SrBi_2Ta_2O_9 Ferroelectric Thin Films by Liquid Source Misted Chemical Vapor Deposition Method Using Inorganic Salt Solution

机译:使用无机盐溶液制备液体源雾化学气相沉积法的铁电薄膜

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A liquid source misted chemical vapor deposition (LSMCVD) system was used to deposit SrBi_2Ta_2O_9 ferroelectric thin films on Pt/TiO_2/SiO_2/Si substrates using strontium nitrate, bismuth nitrate and fluorine tantalum acid as the starting ingredients. Citric acid, ethylene glycol, and ethylenediamine-tetraacctic acid were employed as chelating agents to form homogeneous and stable sol. A density, homogenous, crack-free and c-axis oriented SrBi_2Ta_2O_9 thin films were prepared successfully and the resultant thin film exhibits the ferroelectric properties of 2P_r of 3.8 C/cm~2, 2E_c of 60kV/cm at ± 3.5 V, respectively.
机译:使用液态源雾化化学气相沉积(LSMCVD)系统用于使用硝酸锶,硝酸铋和氟钽酸作为起始成分,将Srbi_2Ta_2O_9铁电薄膜沉积在Pt / TiO_2 / SiO_2 / Si底物上。柠檬酸,乙二醇和乙二胺 - 四乙酸用作螯合剂以形成均匀且稳定的溶胶。成功制备了密度,均匀,无裂缝和无C轴的SRBI_2TA_2O_9薄膜,所得薄膜在±3.5V的±3.5V的3.8c / cm〜2,2e_r的2p_r的铁电性能分别为6.5℃。

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