首页> 外文会议>NATO Advanced Research Workshop on Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices >MEASUREMENT OF NOISE PARAMETER SET IN THE LOW FREQUENCY RANGE: REQUIREMENTS AND INSTRUMENTATION
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MEASUREMENT OF NOISE PARAMETER SET IN THE LOW FREQUENCY RANGE: REQUIREMENTS AND INSTRUMENTATION

机译:低频范围内噪声参数测量:要求和仪表

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Two basic metrological noise models of a two-port: with noise sources at the input and with noise short-circuit currents, have been described. Noise parameters describing the models including a correlation between currents and/or voltages are measured using indirect and direct methods. Some noise reduction techniques are reported. Two-channel noise measurement system with computer-controlled biasing of a measured device using the Lab VIEW software and noise signal processing procedures has been presented. noise parameter set, noise measurement, instrumentation
机译:已经描述了两个端口的两个基本计量噪声模型:已经描述了输入和噪声短路电流的噪声源。使用间接和直接方法测量描述包括电流和/或电压之间的相关性的模型的噪声参数。报告了一些降噪技术。已经介绍了使用实验室视图软件和噪声信号处理程序的具有计算机控制偏置的双通道噪声测量系统。噪声参数集,噪声测量,仪表

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