首页> 外国专利> Magnetic field measurement arrangement, has low and high frequency measurement systems with the signals from the two circuits combined to give a broad bandwidth, low noise, low drift and fast response time circuit

Magnetic field measurement arrangement, has low and high frequency measurement systems with the signals from the two circuits combined to give a broad bandwidth, low noise, low drift and fast response time circuit

机译:磁场测量装置,具有低频和高频测量系统,两个电路的信号相结合,可提供宽带宽,低噪声,低漂移和快速响应时间的电路

摘要

Arrangement comprises low frequency (NF) and high frequency (HF) measurement systems. The low frequency system comprises an offset compensation circuit (M1-M3, SH) coupled to a first sensor (HS1) and having output signal (A1). The high frequency system has a second sensor (HS2) and delivers a second output signal (A2). A summing circuit (SG) combines the two outputs to give a broad bandwidth measurement.
机译:装置包括低频(NF)和高频(HF)测量系统。低频系统包括耦合到第一传感器(HS1)并具有输出信号(A1)的偏移补偿电路(M1-M3,SH)。高频系统具有第二传感器(HS2),并提供第二输出信号(A2)。求和电路(SG)组合两个输出以提供较宽的带宽测量。

著录项

  • 公开/公告号DE10062292A1

    专利类型

  • 公开/公告日2002-03-07

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号DE2000162292

  • 发明设计人 AUSSERLECHNER UDO;

    申请日2000-12-14

  • 分类号G01R33/06;G01R33/07;

  • 国家 DE

  • 入库时间 2022-08-22 00:27:15

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