The Microstrain Generation in Cryomilted Nickel by Impurity Nitrogen Atoms

摘要

The residual microstrains in cryomilled Ni powders, processed under various cryomilling conditions, are measured by XRD and analyzed using a single line approximation (SLA) method. The results show that the average residual microstrains are in the range of 2 * 10~(-3) ～ 6 * 10~(-3) and the residual microstrain on the (200) plane is higher than those on the other planes by 33 %. The measured microstrain is proposed to evolve from the introduction of N as impurity atoms in Ni lattice may be attributed to the evolution of the residual microstrain. The N atoms tend to stay in the octahedral sites of Ni, and the diameter of N atom is larger than that of the octahedral site of Ni by 48 %. Accordingly, a lattice strain field is expected around interstitial N atoms that are located at octahedral sites. By comparing the crystal structure around the octahedral site of Ni with that of NiiN structure, the lattice strains are estimated to be in the range of 5 ～ 15 %. The results show that the (200) plane has the lattice strains that are two times higher than those in other planes, and this is argued to be the reason for the measured anisotropy of residual microstrain in Ni after cryomilling.