Probes For a Scanning Near-Field Optical Microscope on the Base of Tapered Single-Mode Optical Fiber

摘要

Probes for a scanning near-field optical microscope on the base of a single-mode adiabatically tapered optical fiber have been fabricated by the chemical etching only. The transmission coefficient of light in this probes is 2 -3 order magnitude higher than that of mechanically pulled fiber probes. The probe may be used for green (λ = 0.48 - 0.55 μm), red (0.60 - 0.68 μm) and near infrared (0.78 - 1.05 μm) wavelength ranges. The reason of this effect is explained. Probe of the scanning near-field optical microscope on the base of microstrip line is proposed. Review of optical near-field microscopy, surface structure diagnostics and surface modification with nanometre resolution are observed.