首页> 外文会议>Conference on Hardness Measurements Theory and Application in Laboratories and Industries >USING NEW ATOMIC FORCE MICROSCOPE SOFTWARE TO MEASURE THE HARDNESS OF GRAINS AND MICROCONSTITUENTS
【24h】

USING NEW ATOMIC FORCE MICROSCOPE SOFTWARE TO MEASURE THE HARDNESS OF GRAINS AND MICROCONSTITUENTS

机译:使用新的原子力显微镜软件测量谷物和微耦合的硬度

获取原文

摘要

It is desirable to measure the hardness of individual grains and microconstituents to have control over the mechanical properties of materials. An ultra-micro or nanoindenter is required to make indents small enough to fit inside a single grain or phases that is smaller than 10 mm diameter. Because the indents are too small for an optical microscope an atomic force microscope was used to view the location and measure the contact area. Measuring the contact area of indents from an atomic force microscope image is unreliable because it is difficult to manually locate the indent edge. To solve this problem computerized image analysis software called NanoMc was used to measure the residual indent contact area. This software digitally reconstructed the residual indent back into the fully loaded indentation shape and then measures the contact area and depth. This method avoids the complicated tip rounding and load-frame compliance problems. As an example this method was used to measure the hardness of pearlite and ferrite microconstituents in SAE 1020 steel.
机译:期望测量各种颗粒和微耦合的硬度,以控制材料的机械性能。需要超微或纳米茚,以使浓度足够小,以便在小于10mm直径的单个谷物或相位内配合。因为光学显微镜的缩进太小,原子力显微镜用于观察位置并测量接触面积。从原子力显微镜图像测量缩进的接触面积是不可靠的,因为难以手动定位缩进边缘。为了解决这个问题,电脑化图像分析软件用于测量残余缩进接触区域。该软件将剩余凹痕数字重建回到完全加载的压痕形状,然后测量接触面积和深度。该方法避免了复杂的尖端舍入和负载框架合规性问题。作为一个示例,该方法用于测量SAE 1020钢中珠光体和铁氧体微耦合的硬度。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号