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Ultraprecision Finishing Process for Improving Thickness Distribution of Quartz Crystal Wafer by Utilizing Atmospheric Pressure Plasma

机译:通过利用大气压等离子体改善石英晶晶片厚度分布的超高压整理方法

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We developed new machining process which is named plasma chemical vaporization machining (PCVM) for improving the thickness uniformity of thin quartz crystal wafer. This process utilizes atmospheric pressure plasma, and has excellent performances in removal rate and spatial resolution of the machining. In this process, thickness distribution of the quartz crystal wafer is corrected by numerically controlled machining. By using our correcting process, thickness distribution of an AT cut quartz wafer was improved from 270 nm to 50 nm. And spurious mode in the resonance curve was reduced by improving the parallelism of the quartz crystal wafer.
机译:我们开发了新的加工过程,该加工过程被称为等离子化学汽化加工(PCVM),用于改善薄石英晶晶片的厚度均匀性。该过程利用大气压等离子体,具有优异的切除速率和加工空间分辨率的性能。在该过程中,通过数值控制的加工校正石英晶晶片的厚度分布。通过使用我们的校正过程,切割石英晶片的厚度分布从270nm至50nm提高。通过改善石英晶晶片的平行性,减少了谐振曲线中的杂散模式。

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