Analysis of trapped fluxoids in FeSe_(0.5)Te_(0.5) thin film deposited on a CaF_2 single crystalline substrate by scanning SQUID microscopy

摘要

Though the behavior of fluxoids in a mesoscopic scale is one of the most important issues from both fundamental and engineering point of view, it is not yet well clarified in iron-based superconductors. In this study, we carried out direct observation of trapped fluxoids in FeSe_(0.5)Te_(0.5) epitaxial thin film using by a scanning SQUID microscopy (SSM).