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Development of the XFP Beamline for X-ray Footprinting at NSLS-II

机译:NSLS-II的XFP横梁XFP光束线的开发

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For over a decade, synchrotron-based footprinting studies at the NSLS X28C beamline have provided unique insights and approaches for examining the solution-state structures of large macromolecular assemblies, membrane proteins, and soluble proteins, for time-resolved studies of macromolecular dynamics, and most recently for in vivo studies of RNA-protein complexes. The transition from NSLS to NSLS-II has provided the opportunity to create an upgraded facility for the study of increasingly complex systems; progress on the development of the XFP (X-ray Footprinting for In Vitro and In Vivo Structural Studies of Biological Macromolecules) beamline at NSLS-II is presented here. The XFP beamline will utilize a focused 3-pole wiggler source to deliver a high flux density x-ray beam, where dynamics can be studied on the microsecond to millisecond timescales appropriate for probing biological macromolecules while minimizing sample perturbation. The beamline optics and diagnostics enable adaptation of the beam size and shape to accommodate a variety of sample morphologies with accurate measurement of the incident beam, and the upgrades in sample handling and environment control will allow study of highly sensitive or unstable samples. The XFP beamline is expected to enhance relevant flux densities more than an order of magnitude from that previously available at X28C, allowing static and time-resolved structural analysis of highly complex samples that have previously pushed the boundaries of x-ray footprinting technology. XFP, located at NSLS-II 17-BM, is anticipated to become available for users in 2016.
机译:十多年来,在NSLS X28C光束线基于同步加速器的足迹研究提供了独到的见解和方法,用于检查大大分子组装,膜蛋白,可溶性蛋白的溶液状态下的结构,大分子动力学的时间分辨的研究,最近在体内RNA蛋白质复合物的研究。从NSLS到NSLS-II的过渡提供了机会,创造了日益复杂的系统研究中的一个升级工具;在XFP(X射线足迹在体外和生物大分子的体内结构研究)光束线NSLS处-II的开发进度这里介绍。该XFP束线将利用聚焦3极摇摆源以递送高通量密度的x射线束,其中动力学可以在微秒被研究以毫秒时间尺度适当用于探测生物大分子,同时尽量减少试样的微扰。束线光学器件和诊断使光束尺寸的适应和形状,以适应各种具有入射光束的精确测量样品的形态,并在样品处理和环境控制的升级将允许高度敏感的或不稳定的样品的研究。该XFP束线有望提升相关的磁通密度超过幅度从以前提供的一种以X28C,让静态和以前推的X射线足迹技术的界限非常复杂样品的时间分辨结构分析。 XFP,位于NSLS-II 17-BM,预计在2016年成为可供用户使用。

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