Development of Apparatus for Phase Imaging Using X-Ray Interferometers at BL20XU of SPring-8

摘要

Phase-contrast X-ray imaging, including phase tomography, was performed at the medium-length beamline BL20XU of SPring-8, where undulator X rays were available at 245 m from the source point. A crystal X-ray interferometer and an X-ray Talbot interferometer with transmission gratings were used to perform different kinds of phase-contrast imaging. The crystal X-ray interferometer was devised in that a crystal lamella for beam recombination was thinned down to 40 μm to achieve high-resolution imaging. A quick fringe-scanning mechanism was also constructed enabling the phase measurement with a few second and therefore phase tomography with several minutes. The X-ray Talbot interferometer was studied as a novel and simple method that generated a contrast corresponding to differential phase. Phase tomography was also attained with the X-ray Talbot interferometer.