Phase imaging with a phase-shifting X-ray shearing interferometer using an X-ray line source [Review]

摘要

An X-ray shearing interferometer with a line source is presented. The line source broadens X-ray beams and enables us to obtain a phase image with an X-ray image sensor without mechanical scanning. It can reduce the measuring time compared with image acquisition by mechanical scanning. Small phase difference is measured with the phase shift method using acrylic wedges. Although the output beam is overlapped with the non-interfering beams, we can obtain interference fringes with reasonable contrast. With this system we can obtain a projected phase image of an acrylic plate with cellophane tape. [References: 5]