Films of YBa{sub}2Cu{sub}3O{sub}(7-x) (YBCO) with c-axis orientation were directly deposited on nontextured silver substrates by inclined substrate pulsed laser ablation. The structure of the YBCO films was characterized by X-ray diffraction 2θ-scans, Ω-scans, and pole-figure analysis. A good alignment of the c-axis of the YBCO films was confirmed by the Ω-scans, in which the full width at half maximum of the YBCO(005) was 3.8°. A sharp interface between the YBCO film and Ag substrate was observed by transmission electron microscopy. The surface morphology of the film, examined by scanning electron microscopy, reflected the recrystallization of the Ag substrate. Raman spectroscopy was used to evaluate the quality of the YBCO films. The superconducting transition temperature (T{sub}c) and the critical current density (J{sub}c) of the films were determined by inductive and transport measurements, respectively. T{sub}c = 91 K with a sharp transition and J{sub}c = 2.7 × 10{sup}5A/cm{sup}2 at 77 K in zero external field were achieved on a film with 0.14-μm thickness.
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机译:通过倾斜的基板脉冲激光烧蚀直接沉积具有C轴取向的YBA {sub} 2cu {sub} 3o {sub}(7-x)(ybco)的薄膜通过倾斜的衬底脉冲激光烧蚀直接沉积在非纹理的银基板上。通过X射线衍射2θ - 扫描,ω - 扫描和极值分析表征YBCO薄膜的结构。通过ω-扫描确认了YBCO膜的C轴的良好对准,其中YBCO(005)的半部最大宽度为3.8°。通过透射电子显微镜观察YBCO膜和Ag衬底之间的尖锐界面。通过扫描电子显微镜检查的薄膜的表面形态反射了Ag衬底的再结晶。拉曼光谱用于评估YBCO薄膜的质量。通过电感和传输测量分别确定薄膜的超导转变温度(T {Sub} C)和临界电流密度(J {uS} C)。在具有0.14μm厚度的薄膜上实现具有0.14μm的尖锐过渡的急剧转换和j {sub} c = 2.7×10×sup} 5a / cm {sup} 5a / cm {sup} 5a / cm {sup} 5a / cm {sup} 5a / cm {sup} 5。
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