X-ray crystal spectrometer for the Hanbit mirror device was fabricated by using a spherically bent mica crystal and CCD camera. Calibration measurements include an integrated crystal reflectivity and spectral resolutions were carried out. Four different Bragg angles for the integrated reflectivity measurements from the spherically bent mica crystal have performed. The results were compared with theoretical predictions. The Bragg reflected image from a CCD camera showed that the width of the Bragg reflected image is a function of the distance between crystal and X-ray source. From this imaging characteristic measurement, the spectral resolution demonstrated that the Hanbit X-ray crystal spectrometer has a high spectral resolution. The resolution may also be sufficient for ion temperature measurements if the ion temperatures are above 2 keV.
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