X-Ray Inspection For Optoelectronic Components

摘要

Though amorphous silicon systems have been used for several years by Universal Instruments, Indium Corporation, SMTC, Ford Motor Company, Boeing, and others, few x-ray vendors in the electronics industry have extensive experience with these detectors. However, the growth of Optoelectronics has created new demands on suppliers of x-ray inspection systems. Previous methodology using image intensifier systems is inadequate to the range of material censities that exist in optoelectronics applications. Only x-ray systems based on amorphous silicon techno ogy are able to create clear images of these complex components.