Simulation of Contact Interaction of Nanometer Objects Pushing Using AFM Cantilever as Manipulator

摘要

This paper deals with contact interactions when the atomic force microscopy (AFM) cantilever is used as the manipulation tool for nanometer scale objects pushing. The AFM cantilever is modeled as a three-dimensional force transducer. It can transfer the three-dimensional deflection signals measured by the detection system into three-dimensional force signals. The Johnson-Kendall-Roberts (JKR) contact model, which is selected to describe the contact interactions, is linearized by spring-damping systems. System parameters that may have an effect on the system dynamics are investigated by computer simulation.