Applications of x-ray intensity interferometry

摘要

Intensity interferometry was applied for characterizing hard synchrotron radiation. Propagation of transverse coherence was evaluated by a couple of coincidence measurements, which have different source-to-image distances. Influences of phase object under several conditions were measured and discussed. X-ray pulse width was determined with high accuracy by scanning bandwidth of monochromator. Application to the next generation synchrotron sources was discussed.