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The Effects of Compensation for Scatter, Lead X-Rays and High-Energy Contamination on Lesion Detectability and Activity Estimation in Ga-67 Imaging

机译:散射,铅X射线和高能污染补偿对GA-67成像的病变可检测性和活性估计的影响

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_Compton scatter, lead X-rays and high-energy contamination are major factors affecting image quality in Ga-67 imaging. Scattered photons detected in one photopeak can originate from photons emitted in the same photopeak, as well as from higher energy photons which interacted in the collimator and crystal and lost energy. Furthermore, lead X-rays can be detected in the main energy photopeak (93 keV). We have previously developed two energy-based methods, based on artificial neural networks (ANN) and on a generalized spectral fitting approach (GS), to compensate for scatter, high-energy contamination and lead X-rays in Ga-67 imaging. The aim of the present study is to evaluate under realistic conditions the impact of these phenomena and their compensation on lesion detection and estimation tasks in Ga-67 imaging. ANN and GS were compared on the basis of performance of a three-channel Hotelling observer (CHO), which incorporated internal noise, in detecting the presence of a sphere of unknown size on an anatomic background, as well as on the basis of estimation of lesion activity. Spherical lesions ranging from 2 to 6 cm in diameter, located at several sites in an anthropomorphic torso phantom, were simulated using a Monte Carlo program that modeled all photon interactions in the patient as well as in the collimator and the detector for all decays between 91 and 888 keV. One hundred noise realizations were generated from each very low noise simulated projection. Scatter worsened both the CHO signal-to-noise ratio (SNR) and the estimation accuracy. On average, the presence of scatter led to a 12% reduction in CHO SNR. Correcting for scatter further diminished CHO SNR but to a lesser extent with ANN (5% reduction compared to WIN) than with GS (12%). Both scatter corrections improved performance in activity estimation compared to WIN. ANN yielded better precision (1.8 vs 4%) but greater bias (5.1 vs 3.6%) than did GS.
机译:_Compton散射,铅X射线和高能量污染是影响Ga的67成像的图像质量的主要因素。在一个光峰检测到的散射光子可以从在同一光峰发射的光子,以及从该相互作用在准直器和晶体和丢失的能量更高的能量的光子起源。此外,引线的X射线可在主能量光峰(93千电子伏)来检测。我们之前已经开发了两种基于能量的方法,基于人工神经网络(ANN)和上一个广义谱拟合方法(GS),以补偿散射,高能量污染和Ga的67成像导致的X射线。本研究的目的是在实际条件下评价这些现象及其对病变检测补偿和估计任务Ga的67成像的影响。 ANN和GS的三通道霍特林观察者(CHO),其并入内部噪声,在检测在解剖背景未知尺寸的球体的存在,以及估计的基础上的性能的基础上进行了比较病变活动。球形病变范围从2至6厘米,直径,定位在一个拟人躯干假体的几个位点,进行了使用蒙特卡罗程序,模拟在患者以及在所述准直器和91之间的所有衰变检测器的所有光子的相互作用模拟和888千电子伏。从每个低噪声模拟投影生成一百噪音的实现。散射恶化两者CHO信噪比(SNR)和估计精度。平均来说,散射的存在导致了在CHO SNR降低12%。校正散射进一步降低CHO SNR但与ANN(减少5%相比WIN)比用GS(12%)在较小的程度。这两个散射修正改善活动估计性能比WIN。 ANN得到更好的精度(1.8对4%),但更大的偏差(5.1和3.6%),比没有GS。

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