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Growth mechanism of thin film wide-gap semiconductors by chemical bath deposition technique

机译:化学浴沉积技术薄膜宽间隙半导体的生长机理

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Chemical bath deposition is a thin film technique in which semiconductor thin films of typically 0.02- 1μm thickness are deposited on substrates immersed in dilute baths containing metal ions and a source of sulfide or selenide ions. Many I-VI,II-VI, IV-VI, and V-VI semiconductors are included in the list of materials deposited by this technique, II-VI compounds CdS, CdSe, ZnS and ZnSe being the most investigated. However, a mathematical model describing the growth mechanism of these filmsstill remains to be established. The deposition process consists of a nucleation phase, growth phase, and a terminal phase, each of which depends on the concentration of the ions in the deposition bath, its temperature, dissociation constants of the metal complex ions, etc. In this paper we propose a mathematical model, which can qualitatively account for most of the features of the experimental growth curves of chemically deposited semiconductor films.
机译:化学浴沉积是一种薄膜技术,其中沉积通常0.02-1μm厚度的半导体薄膜在浸入含有金属离子的稀释浴和硫化物或硒化离子源中的基板上沉积在底物上。许多I-VI,II-VI,IV-VI和V-VI半导体包括在该技术沉积的材料列表中,II-VI化合物CDS,CDSE,ZnS和ZnSE是最受研究的。然而,描述了描述这些胶片的生长机制的数学模型仍有待建立。沉积过程包括成核相,生长相和末端相,每种末端相位取决于沉积浴中离子的浓度,其温度,金属复合离子的离解常数等。在本文中,我们提出一种数学模型,可以定性地占化学沉积的半导体膜的实验生长曲线的大多数特征。

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