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The Effects of Film Thickness and Substrate Resistivity on Corrosion of Iron Thin Films

机译:薄膜厚度和衬底电阻率对铁薄膜腐蚀的影响

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This study investigated the corrosion behavior of Fe films with different thicknesses in NaCl solution. It has been reported that nanocrystalline metal thin films are more corrosion resistant than their coarser bulk counterparts, but the effect of thickness is not well characterized. Polarization curves were generated for three iron thin films with thicknesses of 10, 20, and 100 nm and bulk iron in aerated 3.5 wt% NaCl solution at 24°C. All films were deposited on silica substrates, and 20 and 100 nm films were also deposited on silica substrates with a Pt conductive under-layer. The resistivity/conductivity of the samples were measured using a four point probe, and the effects of film and substrate resistivity on corrosion were addressed by comparing polarization curves of thin films with and without the Pt conductive layer. The extent of film corrosion was spatially varied and the variation in localized electrochemical response was measured using scanning vibrating electrode technique (SVET). The corroded films were also characterized by optical microscopy.
机译:本研究研究了在NaCl溶液中具有不同厚度的Fe膜的腐蚀行为。据报道,纳米晶金属薄膜比其较粗散装对应物更耐腐蚀,但厚度的效果并不具备很好的表征。在24℃下为具有厚度为10,20和100nm的三种铁薄膜产生偏振曲线,厚度为10,20和100nm,并在曝气的3.5wt%NaCl溶液中散装铁。将所有薄膜沉积在二氧化硅底物上,并在具有PT导电下层的二氧化硅底物上沉积20和100nm膜。使用四点探针测量样品的电阻率/电导率,通过比较薄膜的偏振曲线与PT导电层的偏振曲线进行解决而对腐蚀进行腐蚀的影响。薄膜腐蚀的程度在空间上变化,并且使用扫描振动电极技术(SVET)测量局部电化学响应的变化。腐蚀的薄膜的特征在于光学显微镜。

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