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Spectroscopic and Electrochemical Analysis of Cu(I) Complex of Copper Sulfate Electroplating Solution and Evaluation of Plated Films

机译:硫酸铜电镀溶液Cu(I)复合物的光谱和电化学分析及镀膜评价

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In this study, we investigated a behavior of cuprous ion (denoted as Cu(I)) in the copper sulfate plating solution and effects of the Cu(I) on a quality of Cu plating film. Through spectroscopic method, two kinds of holding structure of Cu(I) in the plating solution were firstly indicated by analyzing the kinetics of complex forming reaction between the Cu (I) and bathocuproinedisulfonic acid, disodium salt (BCS). One component is ignited from Cu(I) probably incorporated into deep inside of polyethylene glycol (PEG), and the Cu(I) must have steric hindrance of PEG to be interacted with the BCS in plating solution. Another one is a component for Cu(I) which can be instantaneously reacts to the BCS to be complex. In addition, interestingly, it has been shown that instantaneous component is affecting the roughness of Cu plating film. These results indicate that spectroscopic measurement and analysis is effective for the management and evaluation of the plating solution for high quality production.
机译:在该研究中,我们研究了硫酸铜电镀液中Cuprous离子的行为(表示为Cu(I)),Cu(I)对Cu电镀膜的质量的影响。通过光谱法,首先通过分析Cu(I)和浴丙开氢磺酸,二钠盐(BCS)之间的复合成形反应的动力学来首先表明镀液溶液中Cu(I)的两种保持结构。从Cu(I)点燃一个组分可能掺入聚乙二醇(PEG)的深层中,Cu(I)必须具有与镀液溶液中的BCS相互作用的托格特的空间阻力。另一个是Cu(I)的组分,其可以瞬间反应于BCS待复杂。另外,有趣的是,已经表明瞬时组分正在影响Cu电镀膜的粗糙度。这些结果表明,光谱测量和分析对于高质量生产的电镀解决方案的管理和评估是有效的。

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