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Transverse Optical Scattering Measurements of the Core Radius of High-Δ Fibers with 1-nm Resolution

机译:具有1nm分辨率的高δ纤维芯半径的横向光学散射测量

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An optical technique for measuring the core radius of high-Δ optical fibers is proposed in which a laser beam is scattered off the core of a fiber immersed in index-matching fluid. Using a fiber segment that was pulled to form a near-field optical tip, the technique is used to measure variations in the core radius of step-index fibers down to the scale of 1 nm. Standard techniques for measuring the index profile of optical fibers rely on scanning a focused spot of visible light across the cleaved fiber face. Their resolution is therefore limited approximately to the wavelength of visible light, or about 0.5 μm. For step-index fibers with large relative index difference, Δ, and core radii of only a few micrometers, this limited resolution results in a significant distortion of the measured profile. Much greater resolution could theoretically be obtained with scattering or interferometric techniques, ideally to a small fraction of the wavelength. Measurements at the nanometer scale could provide useful information on draw-induced changes in the profile and could conceivably test theories that attribute the abnormally high loss of high-Δ fibers to fluctuations in the core radius. This paper describes a high-resolution scattering technique suitable for high-Δ step-index fibers. The method consists of scattering a focused laser beam off the core of the fiber and analyzing the fringes of the scattering pattern away from the forward direction. It is similar to a conventional light scattering technique used to provide real-time feedback to control the fiber diameter during the draw, except that the fiber is immersed in index-matching fluid. This effectively removes the cladding, vastly simplifies the scattering pattern, and permits much more direct information about the core to be obtained. Analysis of the resulting scattering pattern permits nanometer-scale fluctuations of the core radius to be observed.
机译:提出了一种用于测量高Δ光纤的芯半径的光学技术,其中激光束散布在浸入折射率匹配的流体中的纤维的芯。使用被拉动形成近场光学尖端的纤维段,该技术用于测量阶梯射纤维的核心半径的变化,下降到1nm的等级。用于测量光纤索引轮廓的标准技术依赖于扫描扫描纤维面的可见光聚焦光斑。因此,它们的分辨率约为可见光的波长,或约0.5μm。对于具有大相对指数差,Δ和仅少米的核心半径的阶梯射光纤,该限量分辨率导致测量轮廓的显着变形。理论上可以通过散射或干涉测量技术获得更大的分辨率,理想地达到波长的小部分。纳米级的测量可以提供有关概况中的绘制变化的有用信息,并且可以想到的是测试归因于高δ纤维的异常高损耗的理论,以在核心半径中波动。本文介绍了一种适用于高δ步进纤维的高分辨率散射技术。该方法包括将聚焦激光束从光纤的核心散射,并分析散射图案的条纹远离向前方向。它类似于传统的光散射技术,用于提供实时反馈以控制绘图期间的纤维直径,不同之处在于纤维浸入折射率匹配的流体中。这有效地移除了包层,大大简化了散射模式,并且允许更多地提供有关要获得的核心的直接信息。产生的散射图案的分析允许观察核心半径的纳米级波动。

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