STRIPPING VOLTAMMETRY IMAGING WITH SCANNING ELECTROCHEMICAL MICROSCOPY

摘要

Conventional SECM imaging uses an amperometric or potentiometric scanning tip.However,recent experiments in our group suggest a significant increase in information content is available by employing a voltammetric tip in SECM.In the usual SECM experiment an ultramicroelectrode (UME) is scanned across a surface to collect DC data,i.e.one data point per position.