首页> 外文会议>Symposium on microstructural processes in irradiated materials >Correlation between Structural and Optical Properties of Si Nanocrystals in SiO_2: Model for the Visible Light Emission
【24h】

Correlation between Structural and Optical Properties of Si Nanocrystals in SiO_2: Model for the Visible Light Emission

机译:Si纳米晶体中Si纳米晶体的结构和光学性质的相关性:可见光发射的模型

获取原文

摘要

The correlation between the structural and optical properties of Si nanocrystals embedded in SiO_2 is the key factor to understand their emission mechanism. However, there is a great difficulty in imaging Si nanocrystals in SiO_2 and measuring their size distribution because of the lack of contrast in electron microscopy. We have use here a new method for imaging Si nanocrystals by using high resolution electron microscopy in conjunction with conventional electron microscopy in dark field conditions. Regarding the optical properties, the band-gap energies and photoluminescence have been measured by direct and independent methods. The results have allowed experimental determination, for the first time in this material, of the experimental Stokes shift between absorption and emission as a function of crystallite size. The experimental band-gap versus size correlates well with the most accurate theoretical predictions. Moreover, the photoluminescence energy emission versus crystallite size shows a parallel behaviour to that of band-gap energy. Consequently, the experimental Stokes shift is independent of nanocrystals size and is found to be 0.26+-0.03 eV. This value is almost twice the energy of the Si-O vibration (0.134 eV). These results suggest that the dominant emission of Si nanocrystals passivated with SiO_2 is a fundamental transition spatially located at the Si-SiO_2 interface and with the assistance of a local Si-O vibration.
机译:Si纳米晶体的结构和光学性质与嵌入在SiO_2中的结构和光学性质之间的相关性是了解其排放机制的关键因素。然而,由于电子显微镜缺乏对比度,在SiO_2中成像并测量它们的尺寸分布很大。这里我们在这里使用了通过使用高分辨率电子显微镜与常规电子显微镜在暗场条件下使用高分辨率电子显微镜进行成像Si纳米晶的新方法。关于光学性质,通过直接和独立的方法测量带间隙能量和光致发光。结果允许在这种材料中首次允许实验测定,实验室的斯托克斯作为微晶尺寸的函数之间的吸收和发射之间的转化。实验带 - 差距与尺寸与最准确的理论预测相相关。此外,光致发光能量发射与微晶尺寸显示出与带间隙能量的平行行为。因此,实验斯托克斯偏移与纳米晶体尺寸无关,发现为0.26±0.03eV。该值几乎是Si-O振动的两倍(0.134eV)。这些结果表明,用SiO_2钝化的Si纳米晶体的主导排放是在Si-SiO_2接口处并且在局部Si-O振动的辅助处的基本转变。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号