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Wafer Fusion of GaSb to GaAs

机译:瓦片融合Gaas到GaAs

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摘要

Atomic wafer fusion of GaSb to GaAs,and the transfer of epitaxial GaSb/GaInAsSb/GaSb heterostructures to GaAs by fusion and substrate removal are demonstrated for the first time.Wafers and epilayers were fused with or without application of mechanical pressure at temperatures as low as 350 deg C.A periodic pattern of grooves etched into the GaAs wafer and an overpressure of As and Sb vapor were used to improve covalent bonding.Varying degrees of mass transport and covalent bond formation between wafers were observed in cleaved cross-sections under high-resolution scanning electron microscopy.Epilayers fused without pressure application exhibited significantly better structural and optical properties compared to those fused with pressure.
机译:通过融合和基板去除对GaAs的原子晶片融合,以及通过融合和底物去除的外延气体/脂肪组/喘气异质结构.wefers和epilayers融合或在低至的温度下熔化机械压力350 Deg Ca蚀刻到GaAs晶片中的凹槽的周期性图案和AS和Sb蒸汽的过压来改善共价键合。在高分辨率扫描下,在切割的横截面中观察到晶片之间的质量传递度和共价键在晶片中观察到与融合的压力相比,电子显微镜无需压力施加的粘合剂具有显着更好的结构和光学性质。

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