Testing of quantum dot cellular automata based designs

摘要

There has been considerable research on quantum dots cellular automata as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is a majority voter. In this paper, testing of these devices is investigated and compared with conventional CMOS-based designs. A testing technique is presented; it requires only a constant number of test vectors to achieve 100% fault coverage with respect to the fault list of the original design. A design-for-test scheme is also presented which results in the generation of a reduced test set.