The papers in this volume were presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods held at Santa Clara, CA on 2-3 June, 1997. The workshop was sponsored by ASTM Committee Fl on Electronics and SEMI. In addition to the technical presentations and poster sessions, the workshop included two well-attended panel discussions, the impressions of which are provided in Appendix I.
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机译:1997年6月2日至3日在CA Santa Clara,CA举行的硅复合寿命表征方法的先进研讨会上介绍了该卷的论文。该研讨会由ASTM委员会FL在电子和半自动上赞助。除了技术演示和海报会议外,研讨会还包括两个良好的面板讨论,其印象是附录I中提供的。
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