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A finite element mesh tailored to full NIL process modelling: hot embossing, cool-down and stamp release

机译:针对Full Nil Process造型定制的有限元网:热压花,冷却和邮票

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This paper details the building of a finite element mesh tailored to the simulation of a complete nano-imprint lithography process. In earlier work, a method based on finite elements was used to simulate both the cool-down phase and the stamp release of nano-imprinted structures [1]. This model accounted for the thermo-viscoelastic behaviour of the resist, the adhesion between the stamp and the resist, and the dynamics of the process. It could be connected to another model describing the embossing of the polymer at a temperature far above the glass transition of the resist by means of a fluid-solid interaction solver [2] to reflect a full process, as shown in functional pathway A, Fig. 1.
机译:本文详细介绍了针对完整纳米印记光刻工艺模拟的有限元网格的构建。在早期的工作中,使用基于有限元的方法来模拟冷却相和纳米印迹结构的印章释放[1]。该模型占抗蚀剂的热粘弹性行为,印章与抗蚀剂之间的粘附性,以及该方法的动态。它可以连接到描述聚合物在高于借助于流体 - 固体相互作用求解器[2]的温度的温度下的玻璃转变的另一模型,以反映全过程,如功能途径A所示。1。

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