Evaluation of Russian-grown Cd0.8Zn0.2Te

摘要

More recent Russian grown single crystals of Cd$-0.8$/Zn$- 0.2$/Te (CZT) were evaluated using proton induced x ray emission (PIXE), x ray diffraction (XRD), photoluminescence (PL), infra red (IR) transmission microscopy, leakage current measurements and response to nuclear radiation. Whereas in the past the Russian grown samples were not acceptable for gamma ray detectors application, the present samples had a somewhat better crystallinity and a higher resistivity, and did even show distinct photopeaks for an $+241$/Am spectrum. Differences in the material properties between various Russian (n- and p-type) and U.S. (n-type) CZT are described.