首页> 外文会议>Symposium on structure and evolution of surface >The structure of antigen-antibody layers adsorbed on silica surfaces: a scanning angle reflectometry study
【24h】

The structure of antigen-antibody layers adsorbed on silica surfaces: a scanning angle reflectometry study

机译:吸附在二氧化硅表面上的抗原 - 抗体层的结构:扫描角度反射测量研究

获取原文
获取外文期刊封面目录资料

摘要

Scanning Angle Reflectometry (SAR) is used to investigate the structure of protein layers deposited sequentially,first the antigen and then the antibody, on a silica surface. The reflectivity curves are analyzed by means of the optical invariants, a general description valid in the thin film limit which permits the determination of three and only three structural parameters for a dielectric layer, independent of any model of the layer. The three parameters can be related to the first two moments of the mass density in the layer, or to an average film thickness and density. In addition, a new invariant is constructed which directly yields information about the distribution of mass in the layer, and thus goes beyond the usual uniform layer model.
机译:扫描角度反射测定法(SAR)用于研究依次沉积的蛋白质层的结构,首先在二氧化硅表面上依次沉积的抗原,然后是抗体。通过光学不变的方式分析反射率曲线,概述在薄膜限制中有效的一般描述,该薄膜限制允许确定介电层的三个且仅三个结构参数,与层的任何模型无关。三个参数可以与层中质量密度的前两个瞬间相关,或者平均膜厚度和密度有关。另外,构造了一种新的不变性,其直接产生关于层中质量分布的信息,因此超出了通常的均匀层模型。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号